The time to failure in hours of an electronic component subjected to an accelera

Question

The time to failure in hours of an electronic component subjected to an accelerated life test is shown below. To accelerate the failure test, the units were tested at an elevated temperature (read down, then across). a) Calculate the sample average and standard deviation b) construct a histogram c) construct a stem-and-leaf plot d) Find the sample median and the lower and upper quartiles Electronic Component Failure Time 127 124 121 118 125 123 136 131 131 120 140 125 124 119 137 133 129 128 125 141 121 133 124 125 142 137 128 140 151 124 129 131 160 142 130 129 125 123 122 126

Explanation / Answer

http://www.chinarel.com/onlinebook/AccelTestWeb/time-varying_stress_models_chap_.htm

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