The time to failure of an electronic component subjected to anaccelerated life t

Question

The time to failure of an electronic component subjected to anaccelerated life test is shown. To accelerate the failure test, theunits were tested at an elevated temperature. (read down, thenacross)

Electronic Component Failure Time
127 124 121 118
125 123 136 131
131 120 140 125
124 119 137 133
129 128 125 141
121 133 124 125
142 137 128 140
151 124 129 131
160 142 130 129
125 123 122 126

a)Calculate the sample average and standard deviation
b)Construct a histogram
c)Find the sample median and the lower and upper quartiles

Explanation / Answer

a)Calculate the sample average and standard deviation xbar = 129.975 stdev = 8.802 b)Construct a histogram Sorry, can't append a figure. But here's the frequencydata. Lower         Upper         Frequency 115 120 2 120 125 10 125 130 12 130 135 6 135 140 3 140 145 5 145 150 0 150 155 1 155 160 0 160 165 1 c)Find the sample median and the lower and upper quartiles Q1 = 124 Median = 128 Q2 = 133

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