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1. State the appropriate null and alternative hypotheses for testing whether or

ID: 3228536 • Letter: 1

Question

1. State the appropriate null and alternative hypotheses for testing whether or not the mean etching rate (in nm/min) differs between RF power levels.

2. What is the test statistic from this test?

3. What is the p-value for this test? What is the conclusion at the 0.01 significance level? What does this mean in terms of the context of the problem?

4. In the Tukey Pairwise Comparisons output, which pairs of means are determined to be significantly different? List all such group differences.



Model Summary S R-sq R-sq (adj) R-sq (pred) 91.24 88. 478 1.84696 92.62 Means 99 CI N Mean St Dev Factor Power 160 5 55. 120 2.002 (52.707 57. 533) Power 180 5 58 740 1.674 (56.327 61.153) Power-200 5 62.540 2.053 (60. 127 64.953) Power-220 5 70.880 1.619 (68. 467 73.293) Pooled StDev 1.84 696 Interval Plot of Power 160. Power 180,...

Explanation / Answer

1. For the given problem, the hypotheses is defined as:

Null Hypotheis: The mean ethching rate (in nm/min) does not differ between RF power levels (µ1- µ2 = 0)

Alternative Hypothesis: The mean ethching rate (in nm/min) differs between RF power levels (µ1- µ2 0)

2. Test Statistic is defined as the standardized value that is calculated during a hypothesis test and generalized using the sample data.

Usually the test statistic is considered to be the p-value.

3. Incomplete data

(If p value is less than 0.01, we accept the null hypothesis that the mean etching rate does not differ between RF power levels.

4. Incomplete Data