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Moving to another question will save this response. -Question 7 of 20 Question7

ID: 3324393 • Letter: M

Question

Moving to another question will save this response. -Question 7 of 20 Question7 1.25 points Save Answe Integrated circuits are manufactured on silicon wafers through a process at involves a series of steps. An experiment was carried out to study the effect on the yield of using three methods in the cleansing step (coded to maintain confidentiality). One way ANOVA is used to analyze the differences of the means. The results are as follow SS DF MS P value 19.310 0.00007 Between groups Within Groups (Error) Total 129.12 2 64.56 50.15 15 3.34 179.26 17 Based on these results, using a 1% significance level You conclude that there is SUFFICIENT evidence that the average of the three methods used in the cleansing steps are not all the same You conclude that there is SUFFICIENT evidence that the average of the three methods used in the cleansing steps is different from zero You conclude that there is INSUFFICIENT evidence that the average of the three methods used in te deansng steps are not all the same You conclude that there is INSUFFICIENT evidence that the average of the three methods used in the cleansing steps is different from zero Moving to another question will save this response. Question 7 of 20 Show all Firefox Installer (1)exe iI 12/14/20117

Explanation / Answer

as we can see that p value is less than 0.01 level of significance

you conclude that there is sufficient evidence that the average of the three methods used in the cleansing steps are not all the same.

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